Many functional materials are difficult to analyse by scanning transmission electron microscopy (STEM) on account of their beam sensitivity and low contrast between different phases. The problem becomes even more severe when thick specimens need to be investigated. a situation that is common for materials that are ordered from the nanometre to micrometre length scales or when performi... https://www.roneverhart.com/HP-15-fd0038ca-15-6-FHD-IPS-Laptop-Intel-Processor-N100-3-40-GHz-Intel-UHD-Graphics-8GB-DDR4-512GB-SSD-Windows-11-Hom/